Explain how a scanning electron microscope (SEM) can be used in combination with an energy dispersive X-ray spectrometer (EDS) to perform elemental analysis on extremely small particles by placing the statements in the order that they occur.

SEM provides detailed high resolution images of the sample by rastering a focussed electron beam across the surface and detecting secondary or backscattered electron signal. An Energy Dispersive X-Ray Analyzer (EDX or EDA) is also used to provide elemental identification and quantitative compositional information.

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throwdolbeau throwdolbeau · Answer 2 · 2021-12-30T11:56:50+01:00

Energy Dispersive X-Ray Spectroscopy (EDS) is a chemical microanalysis technique used in conjunction with scanning electron microscopy (SEM).

The EDS technique detects x-rays emitted from the sample during bombardment by an electron beam to characterize the elemental composition of the analyzed volume.
The SEM is an instrument that produces a largely magnified image by using electrons instead of light to form an image. A beam of electrons is produced at the top of the microscope by an electron gun. Once the beam hits the sample, electrons and X-rays are ejected from the sample.
The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.

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