The fabrication process improves the yield from 0.92 to 0.95. The defects per area unit for 0.92 and 0.95 technology are 0.042 per cm² and 0.026 per cm² respectively
The yield is increased by a manufacturing procedure from 0.92 to 0.95 the defects will be;
Given Data
Suppose the area of the die is 2 cm²
The defects per unit area with a yield of 0.92 and 0.95 must be determined
Solution
Equation for yield
Yield = 1/(1+(defects × die area/2)²
The yield equation has been rearranged
Defects = 2×(1√(yield)-1)/die area
First, we find for the technology of 0.92
Defects = 2×(1√(yield)-1)/die area
Putting the value of yield and die are 0.92 and 2 cm² respectively
Defects =2× (1√(0.92-1)/2
Defects = 0.042 per cm²
Now, find for the technology of 0.95
Putting the value of yield and die which are 0.95 and 2 cm² respectively
Defects=2× (1√(0.95-1)/2
Defects=0.026 per cm²
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